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Total internal reflection microscopy
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<p>Total internal reflection microscopy is a specialized optical imaging technique for object tracking and detection utilizing the light scattered from an <a href="/facts/Evanescent_field/svCyRKr7">evanescent field</a> in the vicinity of a <a href="/facts/Dielectric/PnVt9P2G">dielectric</a> interface. Its advantages are a high <a href="/facts/Signal-to-noise_ratio/qohClhyG">signal-to-noise ratio</a> and a high spatial resolution in the vertical dimension. </p>