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Reference.org
Reflectometry
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<p>Reflectometry is a general term for the use of the <a href="/facts/Reflection_(physics)/BhcjDs79">reflection</a> of <a href="/facts/Wave/3ANn7WXS">waves</a> or <a href="/facts/Pulse_(signal_processing)/2v5sWtyB">pulses</a> at <a href="/facts/Interface_(matter)/HnIAndVA">surfaces and interfaces</a> to detect or characterize objects, sometimes to detect anomalies as in fault detection and <a href="/facts/Medical_diagnosis/J47rvb0p">medical diagnosis</a>. </p><p>There are many different forms of reflectometry. They can be classified in several ways: by the used radiation (electromagnetic, ultrasound, particle beams), by the geometry of wave propagation (unguided versus wave guides or cables), by the involved length scales (wavelength and <a href="/facts/Penetration_depth/QW4glQs0">penetration depth</a> in relation to size of the investigated object), by the method of measurement (continuous versus pulsed, polarization resolved, ...), and by the application domain. </p>